Thermal Testing with PDR's Focused IR for Design Validation of Components and PCBs
It is not always convenient to use an environmental test chamber for controlled thermal testing of just a confined area, such as a single component. It would be useful to be able to heat a component and PCB individually to different temperatures in a non-contact way without the use of chambers, nozzles, interchangeable heads or special tooling and on the benchtop. Well good news, that's exactly what we have created here at PDR, the PDR IR-TS Series, Micro-focused IR Thermal Test Systems.
Smartly engineered products, as well as other applications, the IR-TS series have been designed to perform IR thermal tests for design validation testing (of components and PCB assemblies) and component characterization testing. Using PDR's Focused IR from above to heat a Device or Bare Die, the IR heating spot can be simply adjusted from Ø6mm to Ø70mm and with a red light, you can see where it is heating. The substrate or PCB is preheated from the underside by Quartz IR radiant panels. The process is precisely controlled by PDR ThermoActive software using temperature readings from two non-contact IR sensors to simultaneously and independently heat the Component/Die and PCB/Substrate to their target temperatures. The system heats from ambient to 180°C with perfectly controlled ramp-rates from 0°C/min up to 60°C/min and cooling is achieved using vortex based coolers.
In a typical design validation step test (see graph below), during component characterization tests for an automotive application, the new PCB assembly was put through IR thermal testing. Heating from above and below, the die of the component and the PCB were raised in 10°C steps from ambient up to 80°C, with ramp-rates of 20°C/min and 2.5 min soaks. Then while the PCB was held at 80°C to simulate working conditions, the component was stepped further in 10°C increments, 2.5 min soaks, up to 165°C, with all its performance parameters being continuously and conveniently monitored.
First of the series, the benchtop based PDR IR-TS One IR Thermal Test System has been designed to thermally cycle key critical components and assemblies to detect defects. Using PDR’s unique Non-Destructive Dual Thermal Stress Screening Process, based on a variation on HALT/HASS principles, the system is able to focus the testing on suspected problem areas to safely screen out early field failures caused by design, environmental, production and structural defects.
The PDR IR-TS One uses PDR’s unique dual zone IR heating and gas cooling process that independently heats the PCB and component in a safe thermal cycle and can be used during live system/function HALT/HASS testing. The TS One works alongside HALT/HASS/environmental Test Chambers, with the convenience of a benchtop system, so that you can FOCUS on the problem areas, greatly accelerating the process during design testing.
Applications are vast but include, component characterization testing, bare die testing, component and PCBA design validation testing, solder joint validation, polymer bond testing. Industries include automotive, aerospace, defense, medical and consumer electronics. Design validation testing of any new component or PCB assembly for a critical application will benefit from this testing system, bringing thermal testing out of the chamber and on to the bench. IR Thermal testing made easy!